首页> 外国专利> HIGH THROUGHPUT DETECTION OF SMALL GENOMIC DELETIONS AND INSERTIONS

HIGH THROUGHPUT DETECTION OF SMALL GENOMIC DELETIONS AND INSERTIONS

机译:高通量检测小基因缺失和插入

摘要

The invention provides novel methods of making and designing nucleic acid probe libraries for accurate, reliable and specific detection and characterization of small nucleotide insertions or deletions (indels) or SNPs in any target nucleic acid sample. The invention further provides a probe library made by the methods and solid phase substrates coated with such probe libraries. The probe libraries of the invention allow detection of indels in a target nucleic acid segment also called a genetic variant segment. The invention further provides methods of using the probe library to detect the presence of indels in the test nucleic acid sample.
机译:本发明提供了制备和设计核酸探针库的新颖方法,用于精确,可靠和特异性地检测和表征任何靶核酸样品中的小核苷酸插入或缺失(indels)或SNP。本发明进一步提供了通过所述方法制备的探针库和涂覆有此类探针库的固相基质。本发明的探针库允许检测靶核酸片段(也称为遗传变异片段)中的插入缺失。本发明进一步提供了使用探针库检测测试核酸样品中插入缺失的存在的方法。

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