Response characterization of an electronic system under variability effects

摘要

The present invention provides a method and a device for performing a characterization of a description of the composition of an electronic system in terms of a plurality of components used, performances of the plurality of components being described by at least two statistical parameters (21) and at least one deterministic parameter (22). The method according to embodiments of the present invention comprises selecting a plurality of design of experiments points, performing (24) simulations on the selected plurality of design of experiments points, thus obtaining system responses, and determining (25) a response model using the plurality of selected design of experiments points and the system responses. Selecting the plurality of design of experiments points comprises making a first selection of a reduced set of well chosen design of experiments points for the statistical parameters that are representative of the statistical properties of the many possible statistical parameter realizations, and making a second selection of design of experiments points for the at least one deterministic parameter that is representative of the possible limited set of values that such parameter can take.