首页> 外国专利> Amplitude-based approach for detection and classification of hard-disc defect regions

Amplitude-based approach for detection and classification of hard-disc defect regions

机译:基于幅度的硬盘缺陷区域检测与分类方法

摘要

In a hard-disc drive, a defect region on the hard disc is classified as corresponding to either thermal asperity (TA) or media defect (MD) by generating two statistical measures. A first measure (e.g., α1) is based on (i) the magnitudes of one or both of signal values (e.g., equalizer input or output signal values) and the corresponding expected values of those signal values and (ii) the signs of one or both of the signal values and the expected signal values. A second measure (e.g., α2) is based on the magnitudes of one or both of the signal values and the expected signal values, but not the signs of either the signal values or the expected signal values. The two measures are then compared to determine whether the defect region corresponds to TA or MD.
机译:在硬盘驱动器中,通过生成两个统计量度,将硬盘上的缺陷区域分类为对应于热粗糙(TA)或介质缺陷(MD)。第一度量(例如,α1)基于以下因素:(i)信号值(例如,均衡器输入或输出信号值)中的一个或两个的大小以及这些信号值的相应预期值,以及(ii)一个信号的符号或信号值和预期信号值两者。第二个量度(例如α2)是基于信号值和期望信号值之一或两者的大小,而不是信号值或期望信号值的符号。然后比较这两个量度以确定缺陷区域是对应于TA还是MD。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号