首页> 外国专利> THIN FILM PLATING METHOD FOR SILICON DIOXIDE EVAPORATION, WHICH REDUCES THE PRODUCTION OF PARTICLES DUE TO REACTIVITY BY-PRODUCTS

THIN FILM PLATING METHOD FOR SILICON DIOXIDE EVAPORATION, WHICH REDUCES THE PRODUCTION OF PARTICLES DUE TO REACTIVITY BY-PRODUCTS

机译:二氧化硅薄膜蒸发的薄膜沉积方法,由于反应性副产物而减少了颗粒的产生

摘要

PURPOSE: A thin film plating method for silicon dioxide evaporation, which reduces the production of particles due to reactivity by-products, is provided to perform evaporation in the ultralow temperature near the room temperature and to manufacture a thin film without the thermal bond of a lower plate.;CONSTITUTION: A thin film plating method for silicon dioxide evaporation comprises next steps. A substrate is inserted in a reaction chamber(10). A silicon compound is supplied inside the reaction chamber in order to form an atomic layer on the top of a substrate. Catalyst is supplied. The reaction gas is supplied inside the reaction chamber and reacts with the atomic layer.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于二氧化硅蒸发的薄膜电镀方法,该方法可减少由于反应副产物而产生的颗粒,该方法可在室温附近的超低温下进行蒸发,并制得没有热键合的薄膜。组成:一种用于二氧化硅蒸发的薄膜电镀方法,包括以下步骤。将基板插入反应室(10)中。硅化合物被供应到反应室内,以便在衬底的顶部上形成原子层。提供了催化剂。反应气体在反应室内供给并与原子层反应。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110003045A

    专利类型

  • 公开/公告日2011-01-11

    原文格式PDF

  • 申请/专利权人 MECHARONICS CO. LTD.;

    申请/专利号KR20090060635

  • 发明设计人 KIM HYUN CHANG;JANG HYEOK KYU;

    申请日2009-07-03

  • 分类号C23C16/44;C23C16/40;H01L21/205;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:48

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