SEMICONDUCTOR MEMORY DEVICE, CAPABLE OF IMPROVING THE RELIABILITY OF A DATA READ-OUT PROCESS, AND A DATA READ-OUT METHOD THEREOF

摘要

PURPOSE: A semiconductor memory device and a data read-out method thereof are provided to improve the reliability of read-out data by confirming errors of read-out data from the outside.;CONSTITUTION: A global data bus(GIO1) transmits first data and second data. An error detecting part(20) comprises a latch part and an error measuring part. The latch part latches the first data and the second data in response to a latch control signal. An error measuring part generates a first error detection bit and a second error detection bit by measuring the errors of data bits transmitted from the latch part. A first data output part(30) serially mixes the first data with a first error detection bit. A second data output part(40) serially mixes second data with a second error detection bit.;COPYRIGHT KIPO 2011