METHOD FOR MEASURING RESISTANCE OF A RESISTANCE MEMORY DEVICE AND A SYSTEM THEREOF, CAPABLE OF MEASURING RESISTANCE ACCORDING TO DELAY TIME JUST AFTER DATA IS RECORDED IN THE RESISTANCE MEMORY DEVICE

摘要

PURPOSE: A method for measuring resistance of a resistance memory device and a system thereof are provided to accurately find operational properties and reliability of the resistance memory device.;CONSTITUTION: A pulse generator(102) delays a data writing pulse and a resistance reading pulse by fixed time and applies the data writing pulse and the resistance reading pulse to a resistance memory device. A connection member(104) connects an output unit of the pulse generator with the resistance memory device. An oscilloscope(106) is connected to the resistance memory device. The oscilloscope analyzes the waveform of a pulse outputted from the resistance memory device. A data processing member(108) measures resistance of the resistance memory device using the output pulse waveform and the internal resistance of the oscilloscope.;COPYRIGHT KIPO 2011