DEVICE AND METHOD FOR INSPECTING THE DRAWBACK OF A CONDUCTOR USING THE PHASE MEASURING OF AN ALTERNATING SIGNAL, CAPABLE OF RAPIDLY INSPECTING THE DRAWBACK OF THE CONNECTING PART OF A CONDUCTOR BY MEASURING THE PHASE DIFFERENCE BETWEEN AN INPUT VOLTAGE SIGNAL AND AN OUTPUT CURRENT SIGNAL

摘要

PURPOSE: Device and method for inspecting the drawback of a conductor using the phase measuring of an alternating signal are provided to discover the drawback of a target conductor since current density on a the target conductor is concentrated on a particular path, which minimizes inductance to a high-frequency alternating signal.;CONSTITUTION: A device for inspecting the drawback of a conductor comprises a first probe(210), a second probe(220), a current guide unit(240), a signal input unit, and a phase measuring unit. One side of the first probe makes contact with the first position of a target conductor. The second probe makes contact with the second position of the target conductor. The current guide unit is connected to the other side of the first probe and horizontally crosses the target area of the target conductor. The signal input unit applies alternating input voltage to one of the first and second probes. The phase measuring unit detects output current from the other of the first and second probes.;COPYRIGHT KIPO 2011