首页> 外国专利> METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE CAPABLE OF SIMPLIFYING MANUFACTURING PROCESSES BY ELIMINATING AN ANNEAL PROCESS AFTER SOURCE/DRAIN IMPURITY IONS ARE IMPLANTED

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE CAPABLE OF SIMPLIFYING MANUFACTURING PROCESSES BY ELIMINATING AN ANNEAL PROCESS AFTER SOURCE/DRAIN IMPURITY IONS ARE IMPLANTED

机译:引入了源/漏杂质离子之后消除了退火过程的制造能够简化制造过程的半导体器件的方法

摘要

PURPOSE: A method for manufacturing a semiconductor device is provided to perform an annealing process after a silicon film is deposited, thereby simplifying manufacturing processes. ;CONSTITUTION: A gate electrode(130) is formed on a semiconductor substrate and a spacer(150) is formed on both sides of the gate electrode. Impurity ions for forming a source/drain area(160) are implanted onto the surface of the semiconductor substrate of the gate electrode. The semiconductor substrate is loaded on processing equipment so that a silicon oxide film is deposited on the semiconductor substrate.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于制造半导体器件的方法,以在沉积硅膜之后执行退火工艺,从而简化制造工艺。组成:栅电极(130)形成在半导体衬底上,并且隔离物(150)形成在栅电极的两侧。将用于形成源极/漏极区(160)的杂质离子注入到栅电极的半导体衬底的表面上。将半导体衬底装载到处理设备上,以便在半导体衬底上沉积氧化硅膜。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110064897A

    专利类型

  • 公开/公告日2011-06-15

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20090121668

  • 发明设计人 KO YOUNG SUN;

    申请日2009-12-09

  • 分类号H01L29/78;H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:43

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