首页> 外国专利> PROBE FOR MEASURING A DIELECTRIC CONSTANT AND A SYSTEM AND METHOD FOR MEASURING THE DIELECTRIC CONSTANT USING A RESONANT FREQUENCY

PROBE FOR MEASURING A DIELECTRIC CONSTANT AND A SYSTEM AND METHOD FOR MEASURING THE DIELECTRIC CONSTANT USING A RESONANT FREQUENCY

机译:用于测量介电常数的探针以及使用共振频率来测量介电常数的系统和方法

摘要

PURPOSE: A probe for measuring a dielectric constant and a system and method for measuring the dielectric constant using a resonant frequency are provided to supply an accurate design parameter of an electronic device by measuring the change of a dielectric constant.;CONSTITUTION: A probe(10) for measuring a dielectric constant includes a resonant unit(1), an antenna rod(2), and a connection port(3). A resonant unit fills measurement target medium and forms resonance when an electronic wave is fed. The antenna rod is protruded into the resonant unit, radiates an electronic wave, and receives a reflective wave. The connection port feeds the electrode wave to the antenna rod and receives the reflective wave.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于测量介电常数的探针以及一种用于通过共振频率测量介电常数的系统和方法,以通过测量介电常数的变化来提供电子设备的准确设计参数。用于测量介电常数的10)包括谐振单元(1),天线杆(2)和连接端口(3)。共振单元填充测量目标介质,并在馈入电子波时形成共振。天线杆伸入谐振单元,辐射电子波,并接收反射波。连接端口将电极波馈送到天线杆并接收反射波。; COPYRIGHT KIPO 2012

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