首页> 外国专利> CRACK LENGTH MEASURING DEVICE AND METHOD WHICH MEASURE THE DC POTENTIAL VALUES OF A METAL SPECIMEN AND A CORRECTION SPECIMEN BY APPLYING CURRENT

CRACK LENGTH MEASURING DEVICE AND METHOD WHICH MEASURE THE DC POTENTIAL VALUES OF A METAL SPECIMEN AND A CORRECTION SPECIMEN BY APPLYING CURRENT

机译:用电流测量金属试样和矫正试样的直流电势值的裂纹长度测量装置和方法

摘要

PURPOSE: A crack length measuring device and method are provided to precisely measure the crack length of a metal specimen with crack in real time even under varying exterior temperature.;CONSTITUTION: A crack length measuring device comprises a power supply unit(100) which supplies DC constant current, a correction specimen(110) which is serially connected between a metal specimen and the power supply unit, a first voltage measuring unit(130) which measures a first DC potential difference value of the metal specimen, a second voltage measuring unit(140) which measures a second DC potential difference value of a correction specimen, and a cracking length calculating unit(150) which calculates corrected crack length by dividing the first DC potential difference value by the second DC potential difference value.;COPYRIGHT KIPO 2012
机译:目的:提供一种裂缝长度测量装置和方法,即使在外部温度变化的情况下,也可以实时精确地实时测量带有裂纹的金属试样的裂缝长度。;组成:裂缝长度测量装置包括一个电源单元(100)直流恒定电流,在金属试样和电源单元之间串联连接的校正试样(110),测量金属试样的第一直流电势差值的第一电压测量单元(130),第二电压测量单元(140)测量校正样本的第二DC电势差值,以及裂纹长度计算单元(150),其通过将第一DC电势差值除以第二DC电势差值来计算校正的裂纹长度。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110119160A

    专利类型

  • 公开/公告日2011-11-02

    原文格式PDF

  • 申请/专利权人 KOREA ELECTRIC POWER CORPORATION;

    申请/专利号KR20100038700

  • 发明设计人 KIM HONG DEOK;JUNG YONG CHAN;

    申请日2010-04-26

  • 分类号G01N27/20;G01B7/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:49

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