IMPEDANCE CALIBRATION CIRCUIT EQUIPPED WITH A TEST CALIBRATION ACTION MODE CAPABLE OF REDUCING CALIBRATION OPERATING THE FOR IMPEDANCE MATCHING IN THE PROBE TEST AND A SEMICONDUCTOR DEVICE INCLUDING THE SAME

摘要

PURPOSE: An impedance calibration circuit and a semiconductor device including the same are provided to reduce calibration operating time by increasing the calibration action frequency in the low frequency environment.;CONSTITUTION: A calibration circuit comprises a calibration part(420) and controller(410). The calibration part creates an impedance code in order to control a termination impedance value. The controller controls so that frequency which renews the impedance code in a high speed mode is higher than the frequency which renews the impedance code in a high low speed mode. The controller controls the renewal of the impedance code at every A clock in the high speed mode. The controller controls the renewal of the impedance code at every B clock in the low speed mode.;COPYRIGHT KIPO 2012