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Reference Material for Nondestructive Photo-Infrared Thermography and Inspection Method of using the same

机译:无损光红外热成像参考材料及其使用方法

摘要

The present invention is an optical-infrared non-destructive testing for reference materials and relates to the non-destructive testing method using the same More particularly, the light-infrared non-destructive testing equipment can be optimized by arrangement and test conditions maximum performance is exhibited, in a state where optimized to easily inspect the defect on the actual subject light - infrared relates to non-destructive infrared reference substance for inspection and non-destructive inspection method using the same. ; To this end, the present invention includes the steps of forming a plurality of defective parts at regular intervals or non-uniform interval on the one surface of the metal plate having a predetermined area , between the defective portions are detected bipagwa minimum diameter by the testing device, maximum diameter, minimum diameter, and at the same time formed in a diameter between the maximum diameter can be detected by the testing device bipagwa minimum depth, maximum depth, the minimum depth to the maximum depth wherein the light formed by the depth-infrared imaging provides reference material and the non-destructive testing method for non-destructive testing using the same
机译:本发明是用于参考材料的光学红外无损检测,并且涉及使用该材料的无损检测方法。更具体地,可以通过布置和测试条件使光红外无损检测设备最优化。在最优化以容易地检查实际对象光上的缺陷的状态下,红外显示涉及用于检查的非破坏性红外参考物质和使用该非破坏性红外参考物质的方法。 ;为此,本发明包括以下步骤:在具有预定面积的金属板的一个表面上以规则的间隔或不均匀的间隔形成多个缺陷部分,通过测试来检测缺陷部分之间的比帕格瓦最小直径。装置中,最大直径,最小直径,以及同时形成在最大直径之间的直径,可以通过测试装置bipagwa来检测最小深度,最大深度,最小深度到最大深度,其中光所形成的深度红外成像提供了参考材料以及使用该材料进行无损检测的无损检测方法

著录项

  • 公开/公告号KR101077043B1

    专利类型

  • 公开/公告日2011-10-26

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20090009465

  • 发明设计人 박정학;최만용;강기수;

    申请日2009-02-05

  • 分类号G01N1/28;G01N21/88;G01N25/72;

  • 国家 KR

  • 入库时间 2022-08-21 17:49:36

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