Device for contacting for the test of at least one test object, test system and method for testing of test objects

摘要

A method for testing of test objects on a substrate (140) with a plurality of test objects (301; 401), wherein for testing a test device with an optical axis (102) and a to the optical axis associated test - range is used, with the following steps:– laying of the substrate on a holder (130);– contacting a first test object with a contacting unit (150) which a maximum of the dimension of the half of the holder dimension in a direction perpendicular to the optical axis;– positioning of the substrate (140) and the optical axis (102) relative to one another, so that a first area (303) of the first test object in the test - area (302) of the test device is;– testing of the first region of the test object;– displacement of the substrate and the optical axis relative to one another, so that at least a further region (304) of the first test object in the test - region of the test device, the contacting unit is displaced, so that the position of the contacting unit in relation to the..