A method for compensation of responses of eddy current probes

摘要

A method for testing a component with the use of an eddy current - array probe (ecap), said method comprising:Scanning a surface of the component with the ecap;Detecting a plurality of part defect answers with the ecap;Transmitting the plurality of part defect responses to a processor;Modeling of the plurality of part defect responses as a mathematical functions on the basis of at least either a configuration of elements of the ecap and / or a resolution of the elements; andGenerating a single maximum defect response from the plurality of part defect responses.