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An apparatus for minimizing position measurement errors caused in the case of a contactless determination of

机译:一种用于最小化在非接触式确定时引起的位置测量误差的设备

摘要

A device for detecting or determining the mass or mass fractions of a test piece or of the grammage or surfaces masses proportions of layered material of a material to be measured (4) with the aid of the back scattering method, comprising at least one radiation source (1) for generating a on the product being measured (4) incident initial radiation (3), at least one detector device (2) for the purpose of accommodating at least a part of a scattered radiation (6) of the product being measured (4) scattered initial radiation (3) and at least a scattered radiation adaptation a direction (7), which is designed, at least a part of the scattered radiation (6) into a measuring radiation (6a) to be modified, wherein the measurement radiation (6a) of the detector device (2) can be accommodated, characterized in that the scattered radiation adaptation a direction (7) a light dimming rear-view element (7a) is that the scattered radiation (6) in accordance with the position of their occurrence location (6) and thus trims the beam cross section of the measuring radiation (6a) in a suitable manner in order to signal the action of the 1 / r2-Distance law in the case of approach of the formation of location of the scattered radiation (6) to the a position location of the detector device (2) to counteract.
机译:一种借助反向散射方法来检测或确定试件的质量或质量分数或被测材料的层状材料的克重或表面质量比的装置(4),该装置包括至少一个辐射源(1)用于在被测产品上产生辐射(4)入射的初始辐射(3),至少一个检测器装置(2)用于容纳被测产品的散射辐射(6)的至少一部分(4)散射的初始辐射(3)和至少一个适应方向(7)的散射辐射,该散射辐射被设计成将至少一部分散射辐射(6)转换成待修改的测量辐射(6a),其中可以容纳检测器装置(2)的测量辐射(6a),其特征在于,散射辐射适应方向(7),调光后视元件(7a)是根据他们发生地点的位置(6)并因此以合适的方式修整测量辐射(6a)的光束横截面,以便在接近以下情况时发信号通知1 / r 2 -距离定律的作用散射辐射(6)的位置到检测器设备(2)的位置位置的抵消。

著录项

  • 公开/公告号DE102009012233B4

    专利类型

  • 公开/公告日2011-06-16

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20091012233

  • 发明设计人

    申请日2009-03-07

  • 分类号G01N9/24;G01N23/203;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:56

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