首页> 外国专利> Silicon wafer holes coating method for microlithography application, involves bringing particles with center diameter into prepared holes of substrate, and melting particles brought into prepared holes

Silicon wafer holes coating method for microlithography application, involves bringing particles with center diameter into prepared holes of substrate, and melting particles brought into prepared holes

机译:用于微光刻的硅晶片孔涂覆方法,包括将具有中心直径的颗粒带入基板的准备好的孔中,并将带入的颗粒熔化

摘要

The method involves bringing particles with a center diameter into prepared holes (3), where the center diameter of the particles is smaller than maximum diameter (9) of the holes. The particles brought into the prepared holes are melted. The particles are applied on a substrate surface. The holes are provided with an aspect ratio, which results from depth (7) of the holes and the maximum hole diameter that is larger than 6, where the maximum hole diameter is smaller than 200 micrometer. A laser radiation is irradiated by the holes facing a side of a substrate (1) i.e. silicon wafer. An independent claim is also included for a coating device for filling a prepared hole in a substrate.
机译:该方法包括将具有中心直径的颗粒引入准备好的孔(3)中,其中颗粒的中心直径小于孔的最大直径(9)。带入准备好的孔中的颗粒被熔化。将颗粒施加在基材表面上。孔具有纵横比,该纵横比由孔的深度(7)和最大孔径大于6的结果得出,其中最大孔径小于200微米。面对衬底(1)即硅晶片一侧的孔辐射激光辐射。还包括用于涂覆装置的独立权利要求,所述涂覆装置用于填充基板中的准备好的孔。

著录项

  • 公开/公告号DE102009029374A1

    专利类型

  • 公开/公告日2011-04-07

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT GMBH;

    申请/专利号DE20091029374

  • 发明设计人 PAZIDIS ALEXANDRA;GOEHNERMEIER AKSEL;

    申请日2009-09-11

  • 分类号H01L21/768;H01L21/268;H01L21/321;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:51

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