parametrisches scan registers, digital circuit and method for testing a digital circuit using such a register

摘要

The present invention relates to a register scan parametric. It also relates to a method of testing of a digital circuit with the aid of such a register. The register scan, parametric includes a memory cell (21) having at least one data input (d), adapted to receive a datum of the test (e _ scan), and transferring on its output (s), a representative signal (62) of the input data, by means of a synchronization signal (h). It further comprises a block of parametric test (42) whose input is connected to the output (s) of the cell (21), the output signal (62) of the cell being transferred to the output (s _ reg) of the block (42) through an internal module (61), the internal module operating according to the modes able to modify the output signal (62) of the cellule.l' invention applies in particular for the test of integrated circuits with a high integration density, for example in the field of nano-technology.