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calibration of a profilmesssystems

机译:profilmesssystems的校准

摘要

A method for calibrating a measuring system, which system comprises a structured light source, optics and a sensor. The light source is adapted to produce a light plane or sheet and the optics is located between the light plane and the sensor. The method is performed in order to obtain a mapping from the sensor to the light plane In the method the light source is switched on such that the light plane is produced. In order to account for distortions due to the optics, a mapping calibration profile is introduced in the light plane, wherein the mapping calibration profile comprises at least three points forming a straight line. A non-linear mapping from the sensor to the light plane is then computed by using the at least three points. Next, in order to account for perspective distortions, a homography calibration profile is introduced in the light plane, wherein the homography calibration profile comprises at least four points the relative distance between which are predetermined. A homography from the sensor to at the light plane based on these four points is then computed. A calibration object for using in such a method is also presented.
机译:一种用于校准测量系统的方法,该系统包括结构化光源,光学器件和传感器。光源适于产生光平面或片,并且光学器件位于光平面和传感器之间。执行该方法以便获得从传感器到光平面的映射。在该方法中,接通光源以产生光平面。为了解决由于光学器件引起的畸变,在光平面中引入映射校准轮廓,其中,映射校准轮廓包括至少三个形成直线的点。然后,通过使用至少三个点来计算从传感器到光平面的非线性映射。接下来,为了解决透视畸变,在光平面中引入了单应性校准轮廓,其中,该单应性校准轮廓包括至少四个点,它们之间的相对距离是预定的。然后基于这四个点计算从传感器到光平面的单应性。还提出了用于这种方法的校准对象。

著录项

  • 公开/公告号DE602008004330D1

    专利类型

  • 公开/公告日2011-02-17

    原文格式PDF

  • 申请/专利权人 SICK IVP AKTIEBOLAG;

    申请/专利号DE20086004330T

  • 发明设计人 ANDERSSON ROBERT;TURBELL HENRIK;

    申请日2008-07-04

  • 分类号G01B11/25;G01B21/04;G06T7/00;

  • 国家 DE

  • 入库时间 2022-08-21 17:46:16

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