首页> 外国专利> SKIN MICRORELIEF EVALUATION METHOD BY MEASURING CONTRACTED STATE OF HORNY LAYER

SKIN MICRORELIEF EVALUATION METHOD BY MEASURING CONTRACTED STATE OF HORNY LAYER

机译:一种测量角质层收缩状态的皮肤微评估方法

摘要

PROBLEM TO BE SOLVED: To establish an evaluation method capable of evaluating a state of a microrelief more accurately than the conventional texture evaluation method by focusing attention on a skin microrelief structure and the function thereof.SOLUTION: The establishment of the evaluation method is by measuring a contracted state of a horny layer. The horny layer is a component of a microrelief, and it is possible to evaluate a state of the microrelief more accurately by measuring a contracted state of the horny layer.
机译:要解决的问题:建立一种能够通过关注皮肤微浮雕结构及其功能来比常规纹理评估方法更准确地评估微浮雕状态的评估方法。解决方案:评估方法的建立是通过测量角质层的收缩状态。角质层是微浮雕的组成部分,并且可以通过测量角质层的收缩状态来更准确地评估微浮雕的状态。

著录项

  • 公开/公告号JP2012202969A

    专利类型

  • 公开/公告日2012-10-22

    原文格式PDF

  • 申请/专利权人 SHISEIDO CO LTD;

    申请/专利号JP20110070959

  • 申请日2011-03-28

  • 分类号G01N33/483;A61B5/00;A61B5/107;G01N33/15;G01N33/50;G01N21/17;G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 17:44:44

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