SCATTERING NEAR-FIELD OPTICAL PROBE AND NEAR-FIELD OPTICAL MICROSCOPE INCLUDING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a scattering near-field optical probe, etc. indicating electric field enhancement not only in a wavelength area in which a conventional scattering near-field optical probe indicates electric field enhancement but also in a long wavelength area of visible light.;SOLUTION: In the scattering near-field optical probe generating near-filed light on a tip part of the probe by applying light from a light source to the tip part of the probe, the prove includes a plate-like metallic monocrystal having an acute apex on the tip part of the probe formed by allowing two sides making an angle to intersect with each other, and when light having an electric field component parallel with an axis dividing the acute apex into two parts is applied from the light source to the tip part of the probe, electric field enhancement is indicated also in the long wavelength area of visible light.;COPYRIGHT: (C)2012,JPO&INPIT