The parameter learning manner in the perceptron study device and the perceptron study device, perceptron study program and record

摘要

PPROBLEM TO BE SOLVED: To provide a perceptron learning device with which parameters of high recognition precision can be obtained. PSOLUTION: An evaluation function S having value corresponding to occurrence rates of word disagreement between features obtained from a correct answer sequence and features obtained from hypotheses is obtained, and values of features obtained from the correct answer sequence and those obtained from hypotheses are weighted by the evaluation function, and values of parameters (j) are updated by weighted values of features, and weighted values of parameters (j) are used to perform perceptron algorithm analysis, and a hypothesis showing the largest score value is detected, and the most suitable values of parameters (j) are learnt from the hypothesis showing the largest score value. PCOPYRIGHT: (C)2008,JPO&INPIT