首页> 外国专利> STANDARD GAUGE, METHOD FOR GUARANTEEING MEASURING ACCURACY OF MEASURING INSTRUMENT, METHOD FOR MANUFACTURING STANDARD GAUGE, AND METHOD FOR EVALUATING PERFORMANCE OF MEASURING INSTRUMENT

STANDARD GAUGE, METHOD FOR GUARANTEEING MEASURING ACCURACY OF MEASURING INSTRUMENT, METHOD FOR MANUFACTURING STANDARD GAUGE, AND METHOD FOR EVALUATING PERFORMANCE OF MEASURING INSTRUMENT

机译:标准量规,保证测量仪器精度的方法,制造标准量规的方法和评估测量量具的方法

摘要

PROBLEM TO BE SOLVED: To provide a standard gauge capable of guaranteeing the measuring accuracy even in a case where the luster on the surface of a measuring object by a non-contact type three-dimensional measuring instrument is different, and to provide a method for guaranteeing the measuring accuracy of the measuring instrument, a method for manufacturing the standard gauge, and a method for evaluating the performance of the measuring instrument.;SOLUTION: A standard gauge G1 is configured by assembling 12 flat plates from a flat plate (a) to a flat plate (j) that have different integrated reflectances SCI and diffuse reflectances SCE respectively, when incident light is applied to the object at a prescribed intensity. The integrated reflectance is obtained by measuring a ratio of the intensities of both of specular reflection light and diffuse reflection light to the intensity of the incident light, and the diffuse reflectance is obtained by measuring a ratio of only the intensity of the diffuse reflection light to the intensity of the incident light.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种即使在非接触式三维测量仪器的被测物表面光泽不同的情况下也能够保证测量精度的标准量规,并且提供一种方法。保证测量仪器的测量精度,标准量规的制造方法和评估测量仪器性能的方法;解决方案:标准量规G1是由一块平板(a)组装成12个平板而构成的当以预定强度将入射光施加到物体上时,入射到平板(j)的平板具有不同的积分反射率SCI和漫反射率SCE。通过测量镜面反射光和漫反射光的强度与入射光的强度之比来获得积分反射率,并且通过测量仅漫反射光的强度与入射光的强度之比来获得漫反射率。入射光的强度。;版权所有:(C)2012,日本特许厅&INPIT

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