首页> 外国专利> REFRACTIVE INDEX MEASURING APPARATUS USING GUIDED-MODE RESONANCE GRATING AND REFRACTIVE INDEX MEASURING METHOD

REFRACTIVE INDEX MEASURING APPARATUS USING GUIDED-MODE RESONANCE GRATING AND REFRACTIVE INDEX MEASURING METHOD

机译:引导式共振光栅和折射率测量方法的折射率测量装置

摘要

PROBLEM TO BE SOLVED: To easily calculate an absolute value of the refractive index of a sample with high accuracy even when a structure of the guided-mode resonance grating is not as designed or is displaced.;SOLUTION: A plurality of refractive liquids whose refractive indices are controlled are prepared (S1) and the refractive indices are accurately measured (S2). The respective refractive liquids are in contact with the guided-mode resonance gratings, intensity of emitted light is measured to calculate an angle spectrum, and differential values between a resonance radiation angle and an angle of diffraction or angle of total refraction are obtained (S3, S4). Since a plurality of relations between the refraction index and the differential values are known, fitting using the same is performed, and is stored as a calibration curve (S5, S6, S7). An unknown sample is in contact with the guided-mode resonance grating, an angle of resonance radiation and the like are measured likewise to obtain differential values (S8, S9), the calibration curve is referred to, and a refraction index is obtained from an angle of resonance incidence (S10).;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:即使在导模共振光栅的结构不是按设计或位移的情况下,也可以轻松地以高精度轻松计算样品的折射率的绝对值;解决方案:多种折射液体准备折射率(S1),并精确测量折射率(S2)。各个折射液体与导模共振光栅接触,测量发射光的强度以计算角度光谱,并获得共振辐射角与衍射角或全折射角之间的差值(S3, S4)。由于已知折射率和微分值之间的多个关系,因此使用该关系进行拟合,并将其存储为校准曲线(S5,S6,S7)。未知样品与导模谐振光栅接触,同样测量谐振辐射的角度等以获得微分值(S8,S9),参考校准曲线,并从折射率获得折射率。共振入射角(S10).;版权:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012058218A

    专利类型

  • 公开/公告日2012-03-22

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20100204931

  • 发明设计人 SATO AKIRA;

    申请日2010-09-13

  • 分类号G01N21/27;G01N21/41;

  • 国家 JP

  • 入库时间 2022-08-21 17:41:19

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