首页> 外国专利> ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT METHOD, ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT SYSTEM, ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT DEVICE AND ELECTRONIC APPARATUS PRODUCT

ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT METHOD, ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT SYSTEM, ELECTRONIC APPARATUS COMPONENT REUSE SUPPORT DEVICE AND ELECTRONIC APPARATUS PRODUCT

机译:电子设备组件重用支持方法,电子设备组件重用支持系统,电子设备组件重用支持设备和电子设备产品

摘要

PROBLEM TO BE SOLVED: To enable evaluation of residual lifetime of components of an electronic apparatus product and use of reused components having proper residual lifetime according to a residual lifetime of the electronic apparatus product to be repaired.;SOLUTION: The electronic apparatus product 2 having a temperature sensor 22 and an operation time measuring sensor 23 on a component 20, prepares use state history data of each component 20 based on the measurement data, and stores it in a use state history data storage part 25. An electronic apparatus component reuse support device 1 reads the use state history data from the use state history data storage part 25 when the electronic apparatus product 2 is dismantled, calculates a residual lifetime of each dismantled component and stores the residual lifetime in a reuse component database 125. When the electronic apparatus product 2 is repaired, the device retrieves the reuse component database 125, extracts a component whose component name and model are the same as the ones of the target component and whose residual lifetime is longer than the residual lifetime of the whole electronic apparatus product 2 to be repaired so that replacement and repair of the target component are conducted with the extracted reuse component.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:为了能够评估电子设备产品的部件的剩余寿命,并根据要维修的电子设备产品的剩余寿命来使用具有适当剩余寿命的可重复使用的部件。组件20上的温度传感器22和操作时间测量传感器23,基于测量数据准备每个组件20的使用状态历史数据,并将其存储在使用状态历史数据存储部分25中。电子设备组件重用支持当电子设备产品2被拆卸时,设备1从使用状态历史数据存储部分25中读取使用状态历史数据,计算每个被拆卸的组件的剩余寿命,并将剩余寿命存储在再利用组件数据库125中。产品2被修复,设备检索重用组件数据库125,提取其组件的组件实体名称和型号与目标组件的名称和型号相同,并且其剩余寿命比要维修的整个电子设备产品2的剩余寿命长,因此可以使用提取的重复使用组件进行目标组件的更换和维修。 。;版权:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012058932A

    专利类型

  • 公开/公告日2012-03-22

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20100200406

  • 发明设计人 SHIBATA YUJI;KOIKE MASAAKI;

    申请日2010-09-08

  • 分类号G06Q50/10;

  • 国家 JP

  • 入库时间 2022-08-21 17:41:09

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