首页> 外国专利> METHOD FOR RESISTANCE VALUE COMPENSATION, CIRCUIT HAVING RESISTANCE VALUE COMPENSATION FUNCTION, TEST METHOD OF RESISTANCE VALUE OF CIRCUIT, RESISTANCE VALUE COMPENSATION PROGRAM, TEST PROGRAM OF RESISTANCE VALUE OF CIRCUIT, AND SYSTEM

METHOD FOR RESISTANCE VALUE COMPENSATION, CIRCUIT HAVING RESISTANCE VALUE COMPENSATION FUNCTION, TEST METHOD OF RESISTANCE VALUE OF CIRCUIT, RESISTANCE VALUE COMPENSATION PROGRAM, TEST PROGRAM OF RESISTANCE VALUE OF CIRCUIT, AND SYSTEM

机译:电阻值补偿方法,具有电阻值补偿功能的电路,电路电阻值的测试方法,电阻值补偿程序,电路的电阻值测试程序以及系统

摘要

PROBLEM TO BE SOLVED: To provide a resistance compensating system using an ODT circuit which is simple and high in accuracy.;SOLUTION: An ODT circuit 200 can realize a resistance value equivalent to a designated resistance value by combining a plurality of transistors, and is configured to sequentially change a resistance value realized by selected transistors by selecting transistors to be combined.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种使用简单且精度高的ODT电路的电阻补偿系统。解决方案:ODT电路200可以通过组合多个晶体管来实现等于指定电阻值的电阻值,并且配置为通过选择要组合的晶体管顺序更改由所选晶体管实现的电阻值。;版权所有:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012060140A

    专利类型

  • 公开/公告日2012-03-22

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20110225175

  • 申请日2011-10-12

  • 分类号H01L21/822;H01L27/04;H01L21/82;H03H11/28;G06F12;

  • 国家 JP

  • 入库时间 2022-08-21 17:40:52

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