POWER-CYCLE TESTING DEVICE AND POWER-CYCLE TESTING METHOD

摘要

PROBLEM TO BE SOLVED: To enable large-current and high-speed intermittent energization to a semiconductor device under test, without causing power output decline.;SOLUTION: A power cycle testing device 1 comprises a resistor part DE and a power supply unit 10. The resistor part DE has resistance roughly equal to resistance of an energized semiconductor device TE under test, and is arranged in parallel with the semiconductor device TE under test. A power supply unit 10 alternately energizes the semiconductor device TE under test and the resistor part DE.;COPYRIGHT: (C)2012,JPO&INPIT