首页> 外国专利> METHOD OF MANUFACTURING INVERSE PREVENTION TYPE IGBT EQUIPPED WITH INCLINED SIDE SURFACE

METHOD OF MANUFACTURING INVERSE PREVENTION TYPE IGBT EQUIPPED WITH INCLINED SIDE SURFACE

机译:制造具有侧面倾斜的防逆型IGBT的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of manufacturing an inverse prevention type IGBT equipped with an inclined side surface, causing little unwanted etching that reaches the lower side of an etching mask at the time when forming a slope on the side surface of a semiconductor chip, resulting in no contamination with etching liquid.;SOLUTION: The manufacturing method includes a first step to form an MOS gate structure 10 in an element active region and an aluminum electrode film 18 on one main surface of an n-type semiconductor substrate 30 whose main surface is a (100) surface, a second step to form an ion implantation damage layer 21 with a p-type dopant as an impure substance by ion implantation or a high-concentration p-type layer 21a which is available by activating the ion implantation damage layer 21 on the other main surface, a third step to form a tapered inclined groove 23 by performing wet anisotropic etching on the other surface of the n-type semiconductor substrate, with the ion implantation damage layer or high-concentration p-type layer 21a as a mask, and a fourth step to form a p-type separation layer 4 on an inclined surface 9a constituting the inclined groove 23 by the ion implantation of the p-type dopant.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种制造具有倾斜侧表面的防逆型IGBT的方法,当在半导体的侧表面上形成斜面时,几乎不会引起到达蚀刻掩模的下侧的不希望的蚀刻。解决方案:该制造方法包括第一步,在元件有源区中形成MOS栅极结构10,并在n型半导体衬底30的一个主表面上形成铝电极膜18。其主要表面是(100)表面,第二步是通过离子注入或高浓度p型层21a形成具有p型掺杂剂作为杂质的离子注入破坏层21或高浓度p型层21a。离子注入损伤层21在另一个主表面上,第三步是通过在n型半导体衬底的另一个表面上执行湿各向异性蚀刻,形成锥形倾斜凹槽23,wi离子注入损伤层或高浓度p型层21a作为掩模,以及第四步骤,通过对p-进行离子注入,在构成倾斜槽23的倾斜表面9a上形成p型分离层4。型掺杂剂。;版权:(C)2012,日本特许厅&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号