X-ray detector, method for forming X-ray detector, and method for reducing electromagnetic noise induced in X-ray detector

摘要

The present invention relates to a system and method by which the magnitude of an interfering electrical and/or magnetic field may be sampled locally (in the X-ray detector for example) and reduced or eliminated. More specifically, embodiments comprise a system and method by which an interfering field may be sampled within the same orientation as the X-ray detector panel, and then subtracted out of each respective element sample.