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ANALYTICAL CURVE CREATION METHOD

机译:解析曲线创建方法

摘要

PROBLEM TO BE SOLVED: To provide an analytical curve creation method capable of solving problems of labor in measuring a large number of standard solid samples or difficulty of acquiring standard solid samples.;SOLUTION: An analytical curve creation method includes: a database creation step of creating a database in which a plurality of reference analytical curves are registered; a reference analytical curve storage step of allowing an emission analyzer to store reference analytical curves; an intensity acquisition step of measuring at least one standard solid sample, which contains a measurement target element in a base material with known concentration, by the emission analyzer, and acquiring the intensity of each spectrum of a few types; a correction coefficient calculation step of calculating a correction coefficient which is a detection sensitivity difference between a photodetector of a reference emission analyzer and a photodetector of the emission analyzer; and a correction analytical curve storage step of correcting the stored reference analytical curves by a correction coefficient and allowing the emission analyzer to store the analytical curves.;COPYRIGHT: (C)2012,JPO&INPIT
机译:要解决的问题:提供一种分析曲线创建方法,该方法能够解决测量大量标准固体样品时的人工问题或获取标准固体样品的困难。解决方案:分析曲线创建方法包括:数据库创建步骤创建一个数据库,其中记录了多个参考分析曲线;参考分析曲线存储步骤,允许排放分析仪存储参考分析曲线;强度获取步骤,通过发射分析仪测量至少一个标准固体样品,该标准固体样品在已知浓度的基础材料中包含测量目标元素,并获取几种类型的每个光谱的强度;校正系数计算步骤,计算校正系数,该校正系数是基准发射分析仪的光检测器与发射分析仪的光检测器之间的检测灵敏度差。 COPYRIGHT:(C)2012,JPO&INPIT;以及校正分析曲线存储步骤,该步骤通过校正系数校正存储的参考分析曲线,并允许排放分析仪存储分析曲线。

著录项

  • 公开/公告号JP2012068145A

    专利类型

  • 公开/公告日2012-04-05

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP20100213783

  • 发明设计人 MIYAMA TAKAO;SUGASE AKIRA;

    申请日2010-09-24

  • 分类号G01N21/67;G01N21/73;

  • 国家 JP

  • 入库时间 2022-08-21 17:39:13

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