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The canonical component and its production manner for proofreading, and the electron beam device null which uses

机译:校对的规范成分及其生产方式,以及使用的电子束装置

摘要

PROBLEM TO BE SOLVED: To provide a standard member for calibration capable of specifying easily a calibration position in order to calibrate accurately a magnification in an electron beam device, and the electron beam device using it.;SOLUTION: Highly-accurate length measurement calibration capable of specifying the calibration position can be realized by forming a mark or a label for specifying the calibration position near a super-lattice pattern of the standard member for device calibration. In the standard member for calibration for calibrating the magnification of the electron beam device based on a signal of secondary charged particles detected by irradiating a primary electron beam 11 emitted from the electron beam device onto a substrate 1 having a section of a super-lattice pattern of a laminated structure formed by laminating alternately different materials 4, 5, the substrate has linear patterns 3 arrayed at fixed intervals in a crossing direction to the super-lattice pattern section on the substrate surface in parallel with the lamination, and the section of the linear pattern 3 is constituted to be approximately in the same plane as the super-lattice section, and the position of the super-lattice pattern is specified by the linear pattern.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供用于校准的标准构件,其能够容易地指定校准位置,以便准确地校准电子束装置中的放大倍率;以及使用该标准构件的电子束装置。解决方案:能够进行高精度的长度测量校准可以通过在用于装置校准的标准构件的超晶格图案附近形成用于指定校准位置的标记或标签来实现确定校准位置的过程。在用于通过对从电子束装置发射的初级电子束11照射到具有超晶格图案的部分的基板1上而检测到的次级带电粒子的信号进行校准的用于校准电子束装置的倍率的用于校准的标准构件中在通过交替地层叠不同的材料4、5而形成的层叠结构的基础上,基板具有在与基板平行的层叠方向上与基板上的超格子图案部交叉的方向上以固定间隔排列的线状图案3,以及线性图案3构成为与超晶格截面大致在同一平面上,并且由线性图案指定超晶格图案的位置。; COPYRIGHT:(C)2009,JPO&INPIT

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