In evoked potential

摘要

PROBLEM TO BE SOLVED: To provide an evoked potential inspection apparatus which has high inspection accuracy and can shorten a measurement time.;SOLUTION: The evoked potential inspection apparatus has an evoked potential data recording part which records evoked potential signal data, a wavelet transformation part which performs wavelet transformation to the evoked potential signal data recorded by the evoked potential data recording part, and a display part which displays the evoked potential signal data converted by the wavelet transformation part on a display device.;COPYRIGHT: (C)2010,JPO&INPIT