首页> 外国专利> Weak light specimen imaging unit, low-light specimen imaging devices and low-light specimen imaging method

Weak light specimen imaging unit, low-light specimen imaging devices and low-light specimen imaging method

机译:弱光标本成像单元,低光标本成像装置和低光标本成像方法

摘要

In order to be able to image a specimen emitting low light in a short exposure time by a cooled CCD of 0 ℃ about, low-light specimen image pickup unit, imaging that forms a specimen image of a specimen having a point light source which emits weak light An imaging unit including an imaging means for capturing an image having a plurality of pixels for receiving an optical system, an incident light, corresponding to the specimen, the imaging optical system, of said imaging optical system with a telecentric, or substantially equal size to the pixel by condensing the weak light from the point light source to form an Airy disk smaller than the pixels on the specimen image side.
机译:为了能够在约0℃的冷却的CCD下在短曝光时间内对发出低光的样品进行成像,低光样品图像拾取单元成像,以形成具有点光源的样品的样品图像,该点光源发射出微弱光,包括成像装置的成像单元,该成像装置用于捕获具有多个像素的图像以接收光学系统,所述成像光学系统的与样本,成像光学系统对应的入射光具有远心或基本相等通过聚集来自点光源的弱光以形成比样本图像一侧的像素小的艾里斑的艾里斑,使像素尺寸变大。

著录项

  • 公开/公告号JP4884369B2

    专利类型

  • 公开/公告日2012-02-29

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20070503715

  • 发明设计人 鈴木 浩文;土坂 新一;

    申请日2006-02-16

  • 分类号G02B21/36;G02B21/00;G02B13/00;

  • 国家 JP

  • 入库时间 2022-08-21 17:36:33

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号