TEST APPARATUS AND REPAIR ANALYSIS METHOD

摘要

A test apparatus that tests a memory under test, comprising an address fail memory that stores address fail data for each address; a block fail memory that stores block fail data for each block; a reading section that reads the address fail data from the address fail memory for each block; a row fail counter that, for each row address in a group including a plurality of the blocks in the memory under test, counts the fail cells indicated by the address fail data; and a column fail counter that counts the fails cells for each column address.