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MECHANISMS FOR UTILIZING EFFICIENCY METRICS TO CONTROL EMBEDDED DYNAMIC RANDOM ACCESS MEMORY POWER STATES ON A SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE
MECHANISMS FOR UTILIZING EFFICIENCY METRICS TO CONTROL EMBEDDED DYNAMIC RANDOM ACCESS MEMORY POWER STATES ON A SEMICONDUCTOR INTEGRATED CIRCUIT PACKAGE
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机译:利用效率度量来控制半导体集成式封装中的嵌入式动态随机存取存储器功率状态的机制
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摘要
Power management of an embedded dynamic random access memory (eDRAM) using collected performance counter statistics to generating a set of one or more eDRAM effectiveness predictions. Using a set of one or more eDRAM effectiveness thresholds, each corresponding to one of the set of eDRAM effectiveness predictions, to determine whether at least one eDRAM effectiveness prediction has crossed over threshold. In the case that at least one eDRAM effectiveness prediction has crossed over its threshold, transitioning the eDRAM to a new power state. Power management is achieved by transitioning to a power-off state or self-refresh state and reducing the amount of power consumed by the eDRAM as compared to a power-on state.
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