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Adaptive match metric selection for automatic target recognition

机译:自适应匹配指标选择,用于自动目标识别

摘要

An automatic target recognition system with adaptive metric selection. The novel system includes an adaptive metric selector for selecting a match metric based on the presence or absence of a particular feature in an image and a matcher for identifying a target in the image using the selected match metric. In an illustrative embodiment, the adaptive metric selector is designed to detect a shadow in the image and select a first metric if a shadow is detected and not cut off, and select a second metric otherwise. The system may also include an automatic target cuer for detecting targets in a full-scene image and outputting one or more target chips, each chip containing one target. The adaptive metric selector adaptively selects the match metric for each chip separately, and may also adaptively select an appropriate chip size such that a shadow in the chip is not unnecessarily cut off.
机译:具有自适应度量选择的自动目标识别系统。该新颖系统包括:自适应度量选择器,用于基于图像中特定特征的存在或不存在来选择匹配度量;以及匹配器,用于使用所选择的匹配度量来识别图像中的目标。在说明性实施例中,自适应度量选择器被设计为检测图像中的阴影,并且如果检测到阴影并且没有将其切除则选择第一度量,否则选择第二度量。该系统还可以包括自动目标指示器,其用于检测全场景图像中的目标并输出一个或多个目标芯片,每个芯片包含一个目标。自适应度量选择器针对每个芯片自适应地选择匹配度量,并且还可以自适应地选择适当的芯片尺寸,以使得芯片中的阴影不会被不必要地切除。

著录项

  • 公开/公告号US8170279B2

    专利类型

  • 公开/公告日2012-05-01

    原文格式PDF

  • 申请/专利权人 ALBERT EZEKIEL;BRENT MCCLEARY;

    申请/专利号US20080214833

  • 发明设计人 ALBERT EZEKIEL;BRENT MCCLEARY;

    申请日2008-06-23

  • 分类号G06K9;

  • 国家 US

  • 入库时间 2022-08-21 17:26:52

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