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Method for manufacturing a semiconductor device having a source extension region and a drain extension region

机译:具有源极延伸区和漏极延伸区的半导体器件的制造方法

摘要

There is provided a semiconductor device including: convex semiconductor layers formed on a semiconductor substrate via an insulating film; gate electrodes formed on a pair of facing sides of the semiconductor layers via a gate insulating film; a channel region formed of silicon between the gate electrodes in the semiconductor layers; a source extension region and a drain extension region formed of silicon germanium or silicon carbon on both sides of the channel region in the semiconductor layers; and a source region formed of silicon so as to adjoin to the opposite side of the channel region in the source extension region, and a drain region formed of silicon so as to adjoin to the opposite side of the channel region in the drain extension region in the semiconductor layers.
机译:提供一种半导体装置,包括:经由绝缘膜形成在半导体基板上的凸状的半导体层;以及形成在半导体基板上的凸状半导体层。栅电极通过栅绝缘膜形成在半导体层的一对相对侧上。在半导体层中的栅电极之间由硅形成的沟道区;在半导体层中的沟道区的两侧,由硅锗或硅碳形成的源极延伸区和漏极延伸区;在源极延伸区中,由硅形成的源极区邻接于沟道区的相对侧,在漏极延伸区中,由硅形成的源极区邻接于沟道区的相对侧。半导体层。

著录项

  • 公开/公告号US8124465B2

    专利类型

  • 公开/公告日2012-02-28

    原文格式PDF

  • 申请/专利权人 ATSUSHI YAGISHITA;

    申请/专利号US20100748032

  • 发明设计人 ATSUSHI YAGISHITA;

    申请日2010-03-26

  • 分类号H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 17:26:49

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