首页> 外国专利> Method and measuring assembly for wavelength modulation spectroscopy

Method and measuring assembly for wavelength modulation spectroscopy

机译:波长调制光谱的方法和测量组件

摘要

The method involves using laser light emitted by laser light source (2) into two beams (3,4) as analysis and reference laser beams. The analysis measurement detector (7) or reference measurement detector (9) are provided for detecting respective laser beams passing through to-be-analyzed gas (6). The noise caused by self-mixing effects of demodulated detector signal analysis is reduced by difference of demodulated output signals. The frequency modulated laser light is generated from light source based on nf signal analysis of detector, where n is a positive integer and f is frequency. An independent claim is included for measuring arrangement for performing wavelength modulation spectroscopy.
机译:该方法涉及使用由激光源(2)发射的激光成两束(3,4)作为分析和参考激光束。提供分析测量检测器(7)或参考测量检测器(9),用于检测穿过待分析气体(6)的各个激光束。解调后的检测器信号分析的自混合效应所引起的噪声会因解调后的输出信号的差异而降低。基于检测器的nf信号分析,从光源生成调频激光,其中n为正整数,f为频率。包括用于执行波长调制光谱的测量装置的独立权利要求。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号