首页> 外国专利> PHOTO-RESIST COMPOSITION FOR MANUFACTURING A PROBE ARRAY AND A METHOD FOR MANUFACTURING THE PROBE ARRAY USING THE SAME CAPABLE OF DEPROTECTING A FUNCTIONAL GROUP USING RELATIVELY LOW EXPOSING ENERGY

PHOTO-RESIST COMPOSITION FOR MANUFACTURING A PROBE ARRAY AND A METHOD FOR MANUFACTURING THE PROBE ARRAY USING THE SAME CAPABLE OF DEPROTECTING A FUNCTIONAL GROUP USING RELATIVELY LOW EXPOSING ENERGY

机译:用于制造探针阵列的光致抗蚀剂组合物和一种用于制造探针阵列的方法,该方法使用相对较低的暴露能量,能够对功能组进行同样的保护

摘要

PURPOSE: A photo-resist composition for manufacturing a probe array and a method for manufacturing the probe array using the same are provided to include an onium salt-containing photoacid generating agent and a photo-sensitive agent reactive to i-line light.;CONSTITUTION: A photo-resist composition for manufacturing a probe array includes an onium salt-containing photoacid generating agent and a photo-sensitive agent reactive to i-line light. The onium salt includes sulfonate cation part represented by chemical formula 1 and sulfonate anion part represented by chemical formula 2. In the chemical formula 1, the A, the B, and the C are respectively hydroxyl group, cyclo group, and cycloalkyl group. In the chemical formula 2, the n is between 1 and 3. The X includes C3 to C10 cyclogroup, adamantyl group, and oxygen containing cycloheptane group.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于制造探针阵列的光致抗蚀剂组合物以及使用该光致抗蚀剂组合物的探针阵列的制造方法,其包括含鎓盐的光酸产生剂和对i-线光具有反应性的光敏剂。 :用于制造探针阵列的光致抗蚀剂组合物,其包含含鎓盐的光酸产生剂和对i-线光具有反应性的光敏剂。鎓盐包括由化学式1表示的磺酸根阳离子部分和由化学式2表示的磺酸根阴离子部分。在化学式1中,A,B和C分别是羟基,环基和环烷基。在化学式2中,n在1-3之间。X包括C3至C10环基,金刚烷基和含氧环庚烷基。; COPYRIGHT KIPO 2012

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