首页> 外国专利> BACKLIGHT UNIT INSPECTION APPARATUS CAPABLE OF ACCURATELY DETECTING DEFECTS IN A SHEET MODULE OF A BACKLIGHT UNIT

BACKLIGHT UNIT INSPECTION APPARATUS CAPABLE OF ACCURATELY DETECTING DEFECTS IN A SHEET MODULE OF A BACKLIGHT UNIT

机译:能够精确检测背光单元板中的缺陷的背光单元检查装置

摘要

PURPOSE: A backlight unit inspection apparatus is provided to discriminate defective elements existing between the layers of a sheet module of a backlight unit without damage to the backlight module by compressing the edge of the backlight module and pneumatically pressing the layers of the sheet module.;CONSTITUTION: A backlight unit inspection apparatus(100) comprises a supporter unit(120) which supports a backlight unit, a sheet pressing unit(130) which presses a sheet module supported by the support unit so that the layers of the sheet module contact each other, and an image acquisition unit(140) which acquires an image of the sheet module that is pressed by the sheet pressing unit in order to detect defects of the sheet module.;COPYRIGHT KIPO 2012
机译:目的:提供一种背光单元检查装置,其通过压缩背光模块的边缘并气动地按压该薄片模块的各层,来识别存在于背光单元的薄片模块的各层之间的缺陷元素,而不会损坏背光模块。构成:背光单元检查装置(100)包括支撑背光单元的支撑单元(120),压片单元(130),该压片单元(130)对由支撑单元支撑的片模块进行加压,以使各片模块的各层接触图像获取单元(140),其获取由纸张按压单元按压的纸张模块的图像以检测纸张模块的缺陷。COPYRIGHTKIPO 2012

著录项

  • 公开/公告号KR20110138497A

    专利类型

  • 公开/公告日2011-12-28

    原文格式PDF

  • 申请/专利权人 K.J. PRETECH CO. LTD.;

    申请/专利号KR20100058418

  • 发明设计人 KIM TAE JIN;OH DAE WUN;KWAK YONG HO;

    申请日2010-06-21

  • 分类号G01N21/88;G02F1/13;

  • 国家 KR

  • 入库时间 2022-08-21 17:11:17

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