首页> 外国专利> CURRENT TEST PROBE IN WHICH BENDING FORCE OF A PROBE TIP PART IS DISPERSED TO AN ENTIRE REGION OF A BOUNDARY PART AND A PROBE ASSEMBLY

CURRENT TEST PROBE IN WHICH BENDING FORCE OF A PROBE TIP PART IS DISPERSED TO AN ENTIRE REGION OF A BOUNDARY PART AND A PROBE ASSEMBLY

机译:探针尖端部分弯曲力的当前测试探针分散到边界部分和探针组件的整个区域

摘要

PURPOSE: A current test probe and a probe assembly are provided to prevent damage of a probe tip part by dispersing force applied to a boundary part of the probe tip part and a needle main body.;CONSTITUTION: A concave part(46) has an inner surface arranged on one end of a needle main body. A probe tip part(36) has an acceptance part of the concave part. The probe tip part has a vertical plate shape on the inner surface. The inner surface is comprised of a central region(52) and a lateral region(54). The acceptance part of the probe tip part is located on one or more sides among the central region and the lateral region.;COPYRIGHT KIPO 2012
机译:目的:提供一种电流测试探针和探针组件,以防止通过分散作用在探针尖端部分和针头主体的边界部分上的力来损坏探针尖端部分。组成:凹入部分(46)具有一个内表面布置在针主体的一端。探针顶端部(36)具有凹部的接受部。探针尖端部分在内表面上具有竖直板形状。内表面由中央区域(52)和侧面区域(54)组成。探针尖端部分的接受部分位于中心区域和侧面区域的一侧或多侧。; COPYRIGHT KIPO 2012

著录项

相似文献

  • 专利
  • 外文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号