SYSTEM AND A METHOD FOR TESTING A LED, CAPABLE OF TESTING THE EXISTENCE OF LIGHT EMISSION OF LED CHIPS AT THE SAME TIME

摘要

PURPOSE: A system and a method for testing a LED are provided to reduce the intensity of lights to be within a sensitivity range of an image sensor of an imaging device by using a filter between a plurality of LED chips being mounted in a lead frame and the imaging device photographing emitting states of the LED chips at the same time.;CONSTITUTION: A system(100) for testing a LED comprises a lead frame, a filter(FIL), and an imaging device(ID). A plurality of LED chips being tested at the same time is mounted in the lead frame. The filter reduces the intensity of the lights emitted from the plurality of the LED chips. The imaging device photographs emitting states of the LED chips by being transferred through the filter. The filter reduces the intensity of the lights emitted from the LED chips to be within a sensitivity range of an image sensor of an imaging device.;COPYRIGHT KIPO 2012