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Automatic inspection apparatus for stain in the polarizing plate using color difference analysis

机译:利用色差分析的偏振片污点自动检查装置

摘要

PURPOSE: A method for automatically inspecting a smudge on a polarizing plate by using a color difference analysis is provided to enhance a quality managing ability, to reduce manufacturing time, and to improve producing efficiency. CONSTITUTION: A method for automatically inspecting a smudge on a polarizing plate by using a color difference analysis comprises an inspection unit(40), a light source unit(10), a photographing unit(50), and an computing unit(60). The inspection unit comprises one or more reference polarizing plates(20) and an inspection polarizing plate or polarization device(30). The inspection polarizing plate is mounted on one or more reference polarizing plates. The light source unit is arranged on a surface of the inspection unit and irradiates lights on the inspection unit. The photographing unit is arranged on the other surface of the inspection unit and photographs the inspection polarizing plate or polarization device and transmits images thereof to the computation unit. The computation unit analyzes color differences of the transmitted images of the inspection polarizing plate or polarization device per each inspection region, thereby detecting the minute smudge and quantifying the same as a numeric data.
机译:目的:提供一种通过使用色差分析自动检查偏光板上的污迹的方法,以增强质量管理能力,减少制造时间并提高生产效率。构成:一种利用色差分析自动检查偏光板上的污迹的方法,包括检查单元(40),光源单元(10),摄影单元(50)和计算单元(60)。检查单元包括一个或多个参考偏振片(20)和检查偏振片或偏振装置(30)。检查偏振片安装在一个或多个参考偏振片上。光源单元布置在检查单元的表面上并且将光照射在检查单元上。拍摄单元布置在检查单元的另一表面上,并且拍摄检查偏光板或偏振装置,并将其图像传输至计算单元。计算单元分析每个检查区域的检查偏光板或偏光装置的透射图像的色差,从而检测微小的污迹并将其量化为数值数据。

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