首页> 外国专利> DEVICE FOR MEASURING THE THICKNESS OF A COATED FILM, CAPABLE OF COATING A COATING SOLUTION OF UNIFORM THICKNESS

DEVICE FOR MEASURING THE THICKNESS OF A COATED FILM, CAPABLE OF COATING A COATING SOLUTION OF UNIFORM THICKNESS

机译:一种用于测量涂膜厚度的设备,能够涂装厚度均匀的涂层溶液

摘要

PURPOSE: A device for measuring the thickness of a coated film is provided to measure the thickness of a coated film before a drying process, thereby minimizing wasted base materials.;CONSTITUTION: A device for measuring the thickness of a coated film comprises a roller, a linear actuator(22), a bracket(23), and a sensor unit. The roller is rotated while touching the underside of a base material. The linear actuator is arranged on the top of the roller and comprises a LM guide. The bracket is attached on the linear actuator, thereby reciprocating from side to side along the LM guide. The sensor unit is installed in the bracket.;COPYRIGHT KIPO 2013
机译:目的:提供一种用于测量涂膜厚度的装置,用于在干燥过程之前测量涂膜的厚度,从而最大程度地减少浪费的基材。;组成:一种用于测量涂膜厚度的装置,包括辊子,线性致动器(22),支架(23)和传感器单元。一边接触基材的底面一边使辊旋转。线性致动器布置在辊的顶部,并包括LM导轨。支架安装在线性致动器上,从而沿LM导轨左右移动。传感器单元安装在支架中。; COPYRIGHT KIPO 2013

著录项

  • 公开/公告号KR101185003B1

    专利类型

  • 公开/公告日2012-10-02

    原文格式PDF

  • 申请/专利权人 DAE HEUNG PRECISION INDUSTRY CO. LTD.;

    申请/专利号KR20120028911

  • 发明设计人 PARK JONG SIK;CHOI BYUNG CHOOL;

    申请日2012-03-21

  • 分类号G01B11/06;B05B12/00;B05C21/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:07:27

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号