SUBSTANCE FOR RESEARCHES BY THE METHOD OF STRENGTHENED SURFACE OF COMBINATION SCATTERING

摘要

1. Substrate for research by surface enhanced Raman scattering, including a semiconductor surface containing whiskers, coated with a metal selected from the group consisting of silver, gold, platinum, copper and / or their alloys, characterized in that the semiconductor is gallium nitride-containing and each whisker has a linear defect inside. ! 2. The substrate according to claim 1, characterized in that the whiskers are connected to each other by their ends remote from the semiconductor surface, forming conical beams. ! 3. The substrate according to claim 1 or 2, characterized in that the linear defect is a dislocation or inversion region. ! 4. The substrate according to claim 1 or 2, characterized in that the thickness of the metal film on the semiconductor surface is from 50 nm to 150 nm, preferably from 70 nm to 80 nm. ! 5. The substrate according to claim 1 or 2, characterized in that the length of the whiskers is from 0.2 μm to 2.0 μm, preferably from 0.5 μm to 1.5 μm. ! 6. The substrate according to claim 1 or 2, characterized in that the diameter of the whiskers is from 40 nm to 150 nm, preferably from 50 nm to 70 nm. ! 7. The substrate according to claim 1 or 2, characterized in that the ratio of the length of the whiskers to their diameter is from 5 to 50, preferably from 10 to 30.! 8. The substrate according to claim 1 or 2, characterized in that the surface density of the whiskers is from 108 / cm2 to 1010 / cm2. ! 9. The substrate according to claim 1 or 2, characterized in that the metal is gold. ! 10. The substrate according to claim 1 or 2, characterized in that the gallium-containing nitride is gallium nitride GaN. ! 11. The substrate according to claim 1 or 2, characterized in that