Circuit arrangement consisting of an electronic test circuit for a transceiver and to be tested from the transceiver as well as to be tested, method for testing a transceiver

摘要

Circuit arrangement consisting of an electronic test circuit to be tested for a transceiver, which is configured as an integrated circuit, and to be tested from the transceiver, which has an input and an output, wherein the electronic test circuit has the following features:– an input of the test circuit,– a programmable digital line the emulator (tpe₁, Tpe₂) to simulate of properties of a transmission path, wherein the programmable digital line the emulator (tpe₁, Tpe₂) at the input of the test circuit a first analog data stream (23) receives,– an output of the test circuit for the transmission of a second analog data stream (24), having a programmable digital line the emulator (tpe₁, Tpe₂) variable signal - noise ratio,the input of the test circuit with the output of the transceiver and the output of the test circuit connected to the input of the transceiver are.