首页> 外国专利> Method for manufacturing semiconductor chip for micro-electro-mechanical systems structure used in e.g. acceleration sensor, involves depositing seed layer of polycrystalline silicon on lateral regions of arrangement

Method for manufacturing semiconductor chip for micro-electro-mechanical systems structure used in e.g. acceleration sensor, involves depositing seed layer of polycrystalline silicon on lateral regions of arrangement

机译:用于例如在半导体中使用的微机电系统结构的半导体芯片的制造方法。加速度传感器,包括在装置的侧面区域上沉积多晶硅的籽晶层

摘要

A monocrystalline silicon insulating layer (14) is formed on substrate (10) through insulating layer (12). The monocrystalline silicon insulating layer is patterned such that defined lateral area (16) of the layer remains stationary. A buried layer of conductive material is formed in lateral regions of arrangement outside of defined area. A seed layer of polycrystalline silicon is deposited on lateral regions of the arrangement outside of defined area. The silicon is deposited on monocrystalline silicon layer and on seed layer. An independent claim is included for semiconductor chip.
机译:通过绝缘层(12)在衬底(10)上形成单晶硅绝缘层(14)。对单晶硅绝缘层进行构图,使得该层的限定的侧向区域(16)保持静止。在限定区域之外的布置的横向区域中形成导电材料的掩埋层。在限定区域之外的装置的横向区域上沉积多晶硅的籽晶层。硅沉积在单晶硅层和籽晶层上。半导体芯片包括独立权利要求。

著录项

  • 公开/公告号DE102010039180A1

    专利类型

  • 公开/公告日2012-02-16

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号DE20101039180

  • 发明设计人 REINMUTH JOCHEN;

    申请日2010-08-11

  • 分类号B81C1/00;H01L21/205;B81B3/00;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:25

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号