首页> 外国专利> Method for accurate measurement of attenuation of radiation e.g. photon radiation to measure thickness of paper in metallurgical mill, involves calculating mean attenuation value by successive calculation of specified algebraic equation

Method for accurate measurement of attenuation of radiation e.g. photon radiation to measure thickness of paper in metallurgical mill, involves calculating mean attenuation value by successive calculation of specified algebraic equation

机译:精确测量辐射衰减的方法用光子辐射来测量冶金厂中的纸张厚度,包括通过连续计算指定的代数方程来计算平均衰减值

摘要

The method involves penetrating photon or particle radiation radiated from a collimated radiation source (1) into a material (4) to be examined and on a detector (2) that count arriving photons and/or particles. A number photons and/or particles counted by the detector for a short time interval is detected by a data acquisition and processing unit (3). Frequency distribution of counts is stored in a data field (F) by the processing unit. A mean attenuation value (A) is calculated by the processing unit by successive calculation of a specified algebraic equation. An independent claim is also included for a radiography arrangement for accurate measurement of attenuation of radiation by varying material distributions, comprising a detector.
机译:该方法包括将从准直辐射源(1)辐射的光子或粒子辐射穿透到待检查的材料(4)中,并在检测器(2)上,该传感器对到达的光子和/或粒子进行计数。由检测器在短时间间隔内计数的光子和/或粒子的数量由数据采集和处理单元(3)检测。计数的频率分布由处理单元存储在数据字段(F)中。处理单元通过连续计算指定的代数方程来计算平均衰减值(A)。还包括用于放射线照相布置的独立权利要求,该放射线照相布置包括通过检测器来通过改变材料分布来精确地测量辐射的衰减。

著录项

  • 公开/公告号DE102010061440A1

    专利类型

  • 公开/公告日2012-06-21

    原文格式PDF

  • 申请/专利权人 HELMHOLTZ-ZENTRUM DRESDEN - ROSSENDORF E.V.;

    申请/专利号DE20101061440

  • 发明设计人 HAMPEL UWE DR.;

    申请日2010-12-21

  • 分类号G01B15/02;G01N23/16;G01D1/02;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:14

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