首页> 外国专利> POLARIMETRIC MEASUREMENT DEVICE AND METHOD WITH MICROSCOPIC RESOLUTION, POLARIMETRY ACCESSORY FOR MICROSCOPE, ELLIPSO-MICROSCOPE AND MICROSCOPE WITH ELLIPSOMETRIC CONTRAST

POLARIMETRIC MEASUREMENT DEVICE AND METHOD WITH MICROSCOPIC RESOLUTION, POLARIMETRY ACCESSORY FOR MICROSCOPE, ELLIPSO-MICROSCOPE AND MICROSCOPE WITH ELLIPSOMETRIC CONTRAST

机译:显微分辨率的极化测量装置和方法,微球,椭圆体显微镜和具有椭圆对比的微镜的极化附件

摘要

The present invention relates to a microscopic resolution polarimetric measuring device comprising in particular polarization conversion means able to modify the polarization of a beam to pass from a spatially uniform distribution to a cylindrical symmetry distribution around the optical axis. and conversely, said converting means being disposed on the axis of a focusing lens (7) for focusing said polarized beam of cylindrical symmetry onto the surface of a sample to be measured. The invention also relates to a micro-ellipsometer, an interferometric contrast microscope, a polarimetric microscope accessory, and a polarimetric measurement method.
机译:显微分辨率偏振测量装置技术领域本发明涉及一种显微分辨率偏振测量装置,特别是包括偏振转换装
置,该偏振转换装置能够改变光束的偏振以从空间均匀分布到围绕光轴的
圆柱对称分布。相反地​​,所述转换装置设置在聚焦透镜(7)的轴线上,用于将所述圆柱对称偏振光束聚焦到待测样品的表面上。本发明还涉及微椭圆仪,干涉对比显微镜,偏振显微镜配件和偏振测量方法。

著录项

  • 公开/公告号FR2962804A1

    专利类型

  • 公开/公告日2012-01-20

    原文格式PDF

  • 申请/专利权人 HORIBA JOBIN YVON SAS;

    申请/专利号FR20100055837

  • 发明设计人 OLIVIER ACHER;

    申请日2010-07-19

  • 分类号G01J4;G01N21/21;G02B21;G02B27/28;

  • 国家 FR

  • 入库时间 2022-08-21 17:04:11

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