首页> 外国专利> System for measuring distance between measuring antenna and electromagnetic reflector, has calculating unit calculates distance from temporal positions corresponding to reflection of emitted wave on measuring antenna

System for measuring distance between measuring antenna and electromagnetic reflector, has calculating unit calculates distance from temporal positions corresponding to reflection of emitted wave on measuring antenna

机译:用于测量测量天线与电磁反射器之间的距离的系统,具有计算单元,该计算单元计算与发射波在测量天线上的反射相对应的时间位置的距离

摘要

The system (100) has a measuring unit (160) for measuring parameter equal to complex ratio between signals. A calculating unit (170) performs the inverse Fourier transform for the averaged parameter so as to obtain an average impulse response to determine a temporal position of a signal peak in the response. The calculating unit calculates distance from temporal positions corresponding to the reflection of an emitted wave on a measuring antenna (111). Independent claims are also included for the following: (1) an electromagnetic reflector (2) a method for measuring a distance between an antenna and an electromagnetic reflector.
机译:系统(100)具有用于测量等于信号之间的复数比的参数的测量单元(160)。计算单元(170)对平均参数执行傅立叶逆变换,以获得平均脉冲响应,以确定响应中信号峰值的时间位置。计算单元从与在测量天线上发射的波的反射相对应的时间位置计算距离(111)。还包括以下方面的独立权利要求:(1)电磁反射器(2)一种测量天线和电磁反射器之间距离的方法。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号