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SURFACE QUALITY MEASURING INSTRUMENT, AND CONTROL DEVICE AND ADJUSTMENT METHOD FOR SURFACE QUALITY MEASURING INSTRUMENT

机译:表面质量测量仪器以及表面质量测量仪器的控制装置和调整方法

摘要

PROBLEM TO BE SOLVED: To provide a surface quality measuring instrument capable of dissolving an error on the whole of each indication range, and to provide a control device and an adjustment method for the surface quality measuring instrument.;SOLUTION: The adjustment method of the surface quality measuring instrument includes: a process P21 for selecting any one of indication ranges Ri as a reference range Rr and setting a calibrating measurement value SAi in each indication range; a process P22 for successively inputting the calibrating measurement values SAi to a range amplifier corresponding to the reference range and acquiring a reference indication value rDATAi; a process P23 for inputting respective calibrating measurement values SAi to the range amplifier corresponding to respective indication ranges and acquiring an AD conversion value ADi and an indication value DATAi; a process P24 for calculating a gain error rate ki=rDATAi/DATAi, indication resolution DIVi=DATAi/ADi and correction indication resolution cDIVi=DIVI*ki; and a process P31 for indicating a correction indication value cDATAi=ADi*cDIVi.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:提供一种能够在每个指示范围的整个范围内解决误差的表面质量测量仪器,并提供用于该表面质量测量仪器的控制装置和调整方法。表面质量测量仪器包括:处理P21,用于选择指示范围Ri中的任何一个作为基准范围Rr,并在每个指示范围中设置校准测量值SAi。步骤P22,将校正后的测量值SAi依次输入至对应于参考范围的范围放大器,并获取参考指示值rDATAi;处理P23,用于将各个校准测量值SAi输入到对应于各个指示范围的范围放大器,并获取AD转换值ADi和指示值DATAi;处理P24,用于计算增益误差率ki = rDATAi / DATAi,指示分辨率DIVi = DATAi / ADi,校正指示分辨率cDIVi = DIVI * ki。表示校正指示值cDATAi = ADi * cDIVi的处理P31。

著录项

  • 公开/公告号JP2013185995A

    专利类型

  • 公开/公告日2013-09-19

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20120051976

  • 发明设计人 KANEMATSU TOSHIHIRO;HONDA HIROOMI;

    申请日2012-03-08

  • 分类号G01B5/00;G01D18/00;

  • 国家 JP

  • 入库时间 2022-08-21 17:03:13

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